#4536 HIGH Never A: Current suspend/resume count should be encoded in CMOS for mfgtest.
Zarro Boogs per Child
bugtracker at laptop.org
Tue Oct 30 12:12:00 EDT 2007
#4536: Current suspend/resume count should be encoded in CMOS for mfgtest.
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Reporter: cjb | Owner: cjb
Type: defect | Status: new
Priority: high | Milestone: Never Assigned
Component: manufacturing process | Version:
Keywords: | Verified: 0
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We want to test for #1835 by doing an aggressive resume-on-broadcast-wifi
test on each laptop in the manufacturing process. If the test fails,
Quanta would like some way of finding out how many cycles the test passed.
(If a laptop dies on its first suspend, it should obviously fail. If it
dies after 50k suspends, it's less clear.)
The task for this bug is to modify the "./run" script for suspend/resume
wakeups to write the current cycle number to CMOS before going down,
possibly with "dd". Mitch says:
"CMOS RAM indices 0x30-0x4f are readily available. There are others but I
expect that those will suffice for you.
/dev/nvram offsets the index so that seeking to 0 in /dev/nvram accesses
CMOS RAM index 0x10. That is because CMOS RAM indices 0-0xf are actually
the RTC registers; /dev/nvram skips the RTC and just maps the RAM portion
of the device. Therefore the available locations from the /dev/nvram
perspective are 0x20-0x2f."
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Ticket URL: <https://dev.laptop.org/ticket/4536>
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