#1656 HIGH BTest-4: Lid close sensor test FAIL on image: 444.

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#1656: Lid close sensor test FAIL on image: 444.
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  Reporter:  chiaying.lin  |       Owner:  dilinger
      Type:  defect        |      Status:  closed  
  Priority:  high          |   Milestone:  BTest-4 
 Component:  kernel        |     Version:          
Resolution:  fixed         |    Keywords:          
  Verified:  0             |  
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Changes (by Luna):

 * cc: Luna (added)

Comment:

 Hi dilinger,

     I write the test program.
     I use the register, 0x10A0, to decide data can read or not by register
 0x10B0.
     Lid event happon when GPIO26 is set.
     So, I design to get lid event by GPIO26 of 0x10B0.

     The source code is below,
     if the program has error please let me understant,
     thanks.

                 if(!(iord(0x10A0) & 0x400))
                 {
                         printf("NBbook Lidded input disable!!\n");

                         iowd(0x10A0, (iord(0x10A0) | 0x400));
                 }
                 for( Count=1; Count < 10; Count++)
                 {
                 Count--;
                 printf("0x10B0=>0x%x\n",iord(0x10B0));
                 if(!(iord(0x10B0) & 0x400))
                 {
                         printf("NBbook Lidded Testing Pass!!\n");
                         exit (0);
                 }
                 sleep (1);
                 }
                 printf("NBbook Lidded Testing Fail!!\n");

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Ticket URL: <http://dev.laptop.org/ticket/1656#comment:6>
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