[Trac #696] Power supply failure in a system.
Zarro Boogs per Child
bugtracker at laptop.org
Tue Jan 9 18:19:21 EST 2007
#696: Power supply failure in a system.
----------------------+-----------------------------------------------------
Reporter: jg | Owner: mfoster
Type: defect | Status: closed
Priority: high | Milestone: BTest-2
Component: hardware | Resolution: fixed
Keywords: |
----------------------+-----------------------------------------------------
Changes (by mfoster):
* status: new => closed
* resolution: => fixed
Comment:
Hi, Folks,
To be complete, we took this failure very seriously, and assigned it the
highest priority. In addition to the battery removal tests noted above,
voltage logging was also done on ten units for six cycles each during all
phases of operation, including battery removal and insertion, power
up/down, etc. The logging results allowed us to completely characterize
operation in all modes. From this data, we were able to ascertain how far
out of spec the capacitor was actually being used. The voltage was found
to be too high by approximately 20% for brief periods of time when the
battery was unplugged while charging, with voltages of ~12V versus a 10V
spec.
To understand exactly how the degree of overvoltage found would impact the
capacitor, we then collected an assortment of 30 different samples of the
same capacitor, attempting to select them from different production
batches. These capacitors were then subjected to an intentional extreme
overvoltage condition to measure the response to this far more serious
stress condition. For each capacitor, the voltage on the bench was
increased until the cap failed; the failure voltage ranged from
approximately 26V to ~31V, at which point the caps would overheat and/or
burn. This far higher voltage range strongly suggested that the initial
failing unit contained a defective capacitor - subsequent sample return
and consultation with the capacitor manufacturer confirmed that while the
cap was operated slightly out of spec, the failed part itself had suffered
from a material defect in manufacturing.
As a consequence of this root cause determination, several changes have
been made to the design of the charging electronics for the B2 build,
including specifying higher voltage ratings for the critical capacitor, as
well as redesign of the charging electronics to remove the voltage peak
when the battery is removed while charging is occurring (this peak was in
fact caused by following the charging IC manufacturer's reference design -
that manufacturer has since accepted our proposed changes to the charging
circuitry which eliminate the peak).
We have high confidence that the revised circuitry design will eliminate
any potential for overvoltage, and the increased design margins will
further reduce the probability of any similar problems.
Best Regards,
MarkF
--
Ticket URL: <http://dev.laptop.org/ticket/696#comment:2>
One Laptop Per Child <http://laptop.org/>
More information about the Bugs
mailing list